Virtual speckle-based X-ray phase-contrast and dark-field imaging with digital phantoms

نویسندگان

چکیده

We demonstrate two versatile, flexible, and accurate frameworks based on numerical Monte Carlo approaches to simulate the X-ray speckle-based (SBI) technique for lab-based systems. The established tools can reproduce experimental setups in a cone-beam geometry with polychromatic sources. Furthermore, they are computationally efficient enable fast virtual multi-modal tomography of digitized inhomogeneous phantoms. proposed methods were evaluated validated by analytical data various samples. approach provides realistic simulation, which is useful diffuser design dosimetry studies, while method very parametric tomographic studies. These will be used optimization SBI generating sample images enhancing phase retrieval algorithms.

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ژورنال

عنوان ژورنال: Optics Express

سال: 2021

ISSN: ['1094-4087']

DOI: https://doi.org/10.1364/oe.444562